SW-based, Run-time Diagnostic Tests to Minimize System-level Effort

  • Kauser Johar, Arm,
  • Mukesh Lahori, Arm

In the automotive world, functional safety is an essential requirement and one of the key issues that is increasingly gaining attention. With ever-growing complexity and size of the SoC and MCUs, the risk from systematic and random hardware failures has increased. To achieve an acceptable level of safety in the vehicle, various safety mechanisms are implemented at different levels, starting from cores and other IPs. This presentation is about detection of random permanent faults in a typical Arm CPU to enable achievement of ASIL B DC metrics at SoC and MCU levels.

  • Date:Wednesday, October 17
  • Time:9:00 AM - 9:50 AM
  • Location:Executive Ballroom 210F
  • Session Type:Conference Session
  • Room:Executive Ballroom 210F
  • Pass Type:All-Access Pass